Paper accepted at DATE 2023

November 21, 2022 | Comments Off on Paper accepted at DATE 2023

The paper entitled “BAFFI: a bit-accurate fault injector for improved dependability assessment of FPGA prototypes”, authored by Ilya Tuzov, David de Andres, Juan-Carlos Ruiz and Carles Hernandez has been accepted at DATE 2023. Abstract FPGA-based fault injection (FFI) is an indispensable technique for verification and dependability assessment of FPGA designs and prototypes. Existing FFI tools […]