Paper accepted at LADC 2024

October 3, 2024 | Comments Off on Paper accepted at LADC 2024

The paper entitled “Allocating ECC parity bits into BF16-encoded CNN parameters: A practical experience report” written by Joaquín Gracia-Morán, Juan Carlos Ruiz Garcia, David de Andrés Martínez and Luis Jose Saiz-Adalid has been accepted at 13th Latin-American Symposium on Dependable and Secure Computing (LADC 2024), that will be held in Recife (Brazil) next November. Abstract […]

Paper available at Springer Link

October 3, 2024 | Comments Off on Paper available at Springer Link

The paper entitled “In-Memory Zero-Space Floating-Point-based CNN protection using non-significant and invariant bits”, and written by Juan Carlos Ruiz Garcia, Luis Jose Saiz-Adalid, David de Andrés Martínez, and Joaquín Gracia-Morán, published at SAFECOMP 2024, can be accesed at this link. Abstract Convolutional Neural Networks (CNNs) have accomplished significant success in various domains, including transportation, health […]

Presentation at IFIP WG 10.4 meeting

July 2, 2024 | Comments Off on Presentation at IFIP WG 10.4 meeting

Juan C. Ruiz has presented the research work done by the Fault tolerant Systems research group of UPV at 86th IFIP WG 10.4 Meeting at Gold Coast, Australia, entitled “On improving the robustness of convolutional neural networks”.

CEDI 2024

June 28, 2024 | Comments Off on CEDI 2024

Juan C. Ruiz, Luis J. Saiz and Joaquín Gracia have attended the CEDI 2024, that was held in A Coruña, Spain. During these days, they have contacted with others researches, exchanging ideas and establishing possible future collaborations

Invited speaker at DNS 2024

June 26, 2024 | Comments Off on Invited speaker at DNS 2024

This June 24, the VERDI workshop (co-located with DSN 2024) was held in Brisbane, Australia. In this workshop, Juan C. Ruiz has been the invited speaker with a talk entitled “On improving the robustness of convolutional neural networks using in-parameter zero-space error correction codes“. The program of VERDI 2024 can be seen here. This talk […]

Presentation at Jornadas SARTECO 2024 (III)

June 26, 2024 | Comments Off on Presentation at Jornadas SARTECO 2024 (III)

J.C. Ruiz-García has presented the paper entitled “Tolerancia a fallos múltiples en redes convolucionales en coma flotante de 16 bits utilizando códigos correctores de errores”, authored by J.C. Ruiz-García, D. de Andrés Martínez, Luis J. Saiz-Adalid and J. Gracia-Morán at Jornadas SARTECO 2024 in A Coruña.

Presentation at Jornadas SARTECO 2024 (II)

June 26, 2024 | Comments Off on Presentation at Jornadas SARTECO 2024 (II)

J. Gracia-Morán has presented the paper entitled “Protección mediante Códigos de Corrección de Errores de los pesos de una Red Neuronal implementada en Arduino”, authored by J. Gracia-Morán and Luis J. Saiz-Adalid at Jornadas SARTECO 2024 in A Coruña.

Presentation at Jornadas SARTECO 2024 (I)

June 18, 2024 | Comments Off on Presentation at Jornadas SARTECO 2024 (I)

Luis J. Saiz-Adalid has presented the paper entitled “Estudio de la confiabilidad de una red neuronal convolucional cuantizada”, authored by J. Gracia-Morán, Luis J. Saiz-Adalid, J.C. Ruiz-García, D. de Andrés Martínez at Jornadas SARTECO 2024 in A Coruña.

Paper available at IEEE early access

May 23, 2024 | Comments Off on Paper available at IEEE early access

The paper entitled “A Hybrid Technique based on ECC and Hardened Cells for Tolerating Random Multiple-Bit Upsets in SRAM arrays”, written by Daniel Gil-Tomás, Luis J. Saiz-Adalid, Joaquín Gracia-Morán, J. Carlos Baraza-Calvo and Pedro J. Gil-Vicente is now available at IEEE Access. Abstract: MBU is an increasing challenge in SRAM memory, due to the chip’s […]

Paper accepted at IEEE Access

May 13, 2024 | Comments Off on Paper accepted at IEEE Access

The paper entitled “A Hybrid Technique based on ECC and Hardened Cells for Tolerating Random Multiple-Bit Upsets in SRAM arrays”, written by Daniel Gil-Tomás, Luis J. Saiz-Adalid, Joaquín Gracia-Morán, J. Carlos Baraza-Calvo and Pedro J. Gil-Vicente has been accepted at IEEE Access. Abstract: MBU is an increasing challenge in SRAM memory, due to the chip’s […]

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